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Ｅｆｆｅｃｔｓ ｏｆ Ｔｅｍｐｅｒａｔｕｒｅ ｏｎ Ｓａｍｐｌｅ Ｐｒｏｐｅｒｔｙ ｏｆ Ａｔｏｍｉｃ Ｏｘｙｇｅｎ Ｔｅｓｔ
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Ｖ５２４.３

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    Abstract:

    Ａｔｏｍｉｃ ｏｘｙｇｅｎ (ＡＯ) ｉｒｒａｄｉａｔｉｏｎ ｔｅｓｔ ｏｆ ＩＴＯ/ Ｔｅｆｌｏｎ/ Ａｇ ｆｉｌｍ ａｎｄ ｖｕｌｃａｎｉｚｅｄ ｓｉｌｉｃｏｎ ｒｕｂｂｅｒ ｉｓ ｃｏｎｄｕｃ￣
    ｔｅｄ ｕｓｉｎｇ ｍｉｃｒｏｗａｖｅ ｉｎｄｕｃｅｄ ＡＯ ｓｉｍｕｌａｔｉｏｎ ｆａｃｉｌｉｔｙ. Ｔｈｅ ｒｅｓｕｌｔｓ ｉｎｄｉｃａｔｅ ｔｈａｔ ｔｈｅ ｍａｓｓ ｏｆ ＩＴＯ/ Ｔｅｆｌｏｎ/ Ａｇ ｆｉｌｍ ｃｈａｎｇｅｓ
    ｖｅｒｙ ｌｉｔｔｌｅ ｗｈｅｎ ｓａｍｐｌｅ ｔｅｍｐｅｒａｔｕｒｅ ｎｏ ｍｏｒｅ ｔｈａｎ １５０℃ꎬｂｕｔ ｔｈｅ ｍａｓｓ ｌｏｓｓ ｉｓ ｉｎｃｒｅａｓｅｄ ｗｉｔｈ ｉｎｃｒｅａｓｉｎｇ ｓａｍｐｌｅ ｔｅｍｐｅｒ￣
    ａｔｕｒｅꎬ ｗｈｉｃｈ ｎｏｔ ｅｘｃｅｅｄｓ １００℃ꎬ ｆｏｒ ｖｕｌｃａｎｉｚｅｄ ｓｉｌｉｃｏｎ ｒｕｂｂｅｒ. Ａｆｔｅｒ ｉｒｒａｄｉａｔｉｏｎꎬ ｔｈｅ ｓｏｌａｒ ａｂｓｏｒｐｔａｎｃｅ ｏｆ ＩＴＯ/ Ｔｅｆｌｏｎ/
    Ａｇ ｆｉｌｍ ｄｉｓｐｌａｙｓ ａ ｍｉｎｏｒ ｃｈａｎｇｅ. Ｉｎ ｃｏｎｔｒａｓｔꎬ ｔｈｅ ｓｏｌａｒ ａｂｓｏｒｐｔａｎｃｅ ｏｆ ｖｕｌｃａｎｉｚｅｄ ｓｉｌｉｃｏｎ ｒｕｂｂｅｒ ｉｓ ｉｎｃｒｅａｓｅｄ ｗｉｔｈ ｉｎ￣
    ｃｒｅａｓｉｎｇ ｔｅｍｐｅｒａｔｕｒｅ. Ｔｈｅ ｅｍｉｓｓｉｖｉｔｙ ｏｆ ｔｈｉｓ ｔｗｏ ｔｙｐｅ ｓａｍｐｌｅｓ ｈａｓ ｎｏ ｏｂｖｉｏｕｓ ｃｈａｎｇｅ.

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  • Online: November 28,2016
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