Abstract:Atomic oxygen (AO) irradiation test of ITO/ Teflon/ Ag film and vulcanized silicon rubber is conduc ̄
ted using microwave induced AO simulation facility. The results indicate that the mass of ITO/ Teflon/ Ag film changes
very little when sample temperature no more than 150℃ꎬbut the mass loss is increased with increasing sample temper ̄
atureꎬ which not exceeds 100℃ꎬ for vulcanized silicon rubber. After irradiationꎬ the solar absorptance of ITO/ Teflon/
Ag film displays a minor change. In contrastꎬ the solar absorptance of vulcanized silicon rubber is increased with in ̄
creasing temperature. The emissivity of this two type samples has no obvious change.