Abstract:X鄄ray diffraction method ( XRD) includes two tasks:qualitative and quantitative analysis. The three
ratios of(Si +TiO2)are analyzed by XRD,the quantitative analysis data were obtained from the rietveld analyses . The
results show that the compositions are close to the real ratio of the samples. The Rietveld methord is reliable for the
quantitative phase analysis. and the relative standard deviation was 依2% (n = 3). The results demonstrate that X鄄ray
powder diffraction combining with the rietveld refinement method is an accurate, convenient and speed鄄up method.