Quantitive Phase Analysis of Si-TiO2 by Rietveld Refinement of XRD Patterns
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    Abstract:

    X鄄ray diffraction method ( XRD) includes two tasks:qualitative and quantitative analysis. The three
    ratios of(Si +TiO2)are analyzed by XRD,the quantitative analysis data were obtained from the rietveld analyses . The
    results show that the compositions are close to the real ratio of the samples. The Rietveld methord is reliable for the
    quantitative phase analysis. and the relative standard deviation was 依2% (n = 3). The results demonstrate that X鄄ray
    powder diffraction combining with the rietveld refinement method is an accurate, convenient and speed鄄up method.

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  • Received:
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  • Online: November 28,2016
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