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DeterminationofLatticeConstantsforC/CCompositesbyUsingX-ray DiffractionTechniqueandRietveldRefinementMethod
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    Abstract:

    Graphitizationdegree,latticeconstantandcrystallitesizesofthreekindsofC/Ccompositesweremeasured byrietveldrefinementmethod(wholespectrumfitting)ofX-raydiffraction.Theresultsshowthatstandarddeviationof crystaltheparameterofthethreeC/Ccompositesislessthan2.0×10-3,standarddeviationofgraphitizationdegree(g)is lessthan1.5,standarddeviationofcrystallitesizes(Lc002)islessthan0.5.RietveldrefinementmethodofX-raydiffractionis effectiveforinvestigationofthecrystalparametersofC/Ccomposite.

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  • Online: November 28,2016
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