航天材料及工艺研究所,先进功能复合材料技术重点实验室,
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利用X 射线衍射仪对不同配比的Si 和TiO2样品进行分析,通过三种定量分析方法(峰高法、积分
强度法、全谱结构拟合法)进行计算,并进行误差分析。结果表明:三种定量分析方法中,全谱结构拟合法最
优,相对误差为依2%( n = 3),误差最小。X 射线衍射全谱拟合法是一种精确,快速的定量方法。
X鄄ray diffraction method ( XRD) includes two tasks:qualitative and quantitative analysis. The three
ratios of(Si +TiO2)are analyzed by XRD,the quantitative analysis data were obtained from the rietveld analyses . The
results show that the compositions are close to the real ratio of the samples. The Rietveld methord is reliable for the
quantitative phase analysis. and the relative standard deviation was 依2% (n = 3). The results demonstrate that X鄄ray
powder diffraction combining with the rietveld refinement method is an accurate, convenient and speed鄄up method.
引用本文
王晓叶. X 射线衍射全谱拟合定量分析方法研究[J].宇航材料工艺,2012,42(2).
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- 在线发布日期: 2016-11-28
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