退火温度对高纯钨靶显微组织和内应力的影响
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Effect of Annealing Temperature on Microstructure and Internal Stress of High Purity Tungsten Target
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    摘要:

    采用热等静压工艺制备了高纯钨靶,并在不同温度下对其进行退火处理。采用金相显微镜、TEM、XRD和硬度计对不同温度退火的高纯钨靶的显微组织和内应力进行表征。结果表明:高纯钨靶经1 200℃真空退火后,保留了热等静压后的细晶组织,晶粒未发生长大,但是位错密度却大幅度减小,晶格畸变率下降,硬度值降低,这是由于退火处理使热等静压高纯钨靶发生回复,内应力得以释放。当退火温度低于1 200℃时,钨靶的内应力去除不完全,当退火温度高于1 200℃时钨靶的晶粒开始长大,故热等静压高纯钨靶的最佳退火温度是1 200℃。

    Abstract:

    High purity tungsten target was prepared by hot isostatic pressing technique and annealed at different temperatures. The microstructure and internal stress of high purity tungsten target were characterized by metallographic microscope, TEM, XRD and hardness tester. The results show that high purity tungsten target after vacuum annealing at 1 200℃ retains the fine grain structure obtained by hot isostatic pressing treatment, grain size does not grow but the dislocation density, lattice distortion and hardness are reduced greatly. This is due to the high purity tungsten target by hot isostatic pressing generates recovery after annealing treatment and the internal stress is released. When the annealing temperature is below 1 200℃, the internal stress of tungsten target cannot be removed completely. When annealing temperature is above 1 200℃, the grain size of the tungsten target begins to grow. So the optimum annealing temperature of high purity tungsten target prepared by hot isostatic pressing is 1 200℃.

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崔子振,林岩松,石刚,李阳,张德智.退火温度对高纯钨靶显微组织和内应力的影响[J].宇航材料工艺,2017,47(4):63-65,74.

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  • 收稿日期:2016-12-05
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  • 在线发布日期: 2017-08-03
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